Low-Dimensional Materials at the Atomic Resolution

Illustration of the novel double-tip scanning probe setup, where an atomic force microscopy scan head approaches a freestanding graphene membrane from one side and a scanning tunneling microscopy tip the same sample location from the other side.

The focus of this joint group is to manipulate and study the atomic structure and properties of novel low-dimensional materials, in particular layered systems such as graphene and heterostructures based on them. Our toolbox includes the combination of electron and ion irradiation complemented by in situ manipulation techniques in a state-of-the-art scanning transmission electron microscope and other methods. We also operate a novel scanning probe device, where two scan units with different modalities are implemented within one microscope, allowing a freestanding sample to be approached simultaneously from both sides. Our aim is to elucidate the relationship between structural modifications and their effect on the electronic, optical, chemical, thermal, and mechanical properties.